CWE-1248
Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
2020-02-24
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特定のCWEの通知
特定のCWEの変更情報をいち早くお届けします。
名前: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
The security-sensitive hardware module contains semiconductor defects.
一般情報
背景の詳細
導入モード
Manufacturing : May be introduced due to issues in the manufacturing environment or improper handling of components, for example.Operation : May be introduced by improper handling or usage outside of rated operating environments (temperature, humidity, etc.)
適用可能なプラットフォーム
言語
クラス： Not Language-Specific (Undetermined)オペレーティングシステム
クラス： Not OS-Specific (Undetermined)アーキテクチャ
クラス： Not Architecture-Specific (Undetermined)テクノロジー
クラス： Not Technology-Specific (Undetermined)一般的な結果
| スコープ | 影響 | 可能性 |
|---|---|---|
| Availability Access Control | DoS: Instability 注記：Semiconductor defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised. |
潜在的な緩和策
Phases : TestingPhases : Operation
脆弱性マッピングノート
理由 : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.コメント : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
関連する攻撃パターン
| CAPEC ID | 攻撃パターン名 |
|---|---|
| CAPEC-624 | Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
| CAPEC-625 | Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
参考文献
REF-1067
Why Chips DieBrian Bailey.
https://semiengineering.com/why-chips-die/
REF-1068
What causes semiconductor devices to failV. Lakshminarayan.
Original
登録情報
| 名前 | 組織 | 日付 | リリース日 | Version |
|---|---|---|---|---|
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi | Intel Corporation | 4.0 |
変更履歴
| 名前 | 組織 | 日付 | コメント |
|---|---|---|---|
| CWE Content Team | MITRE | updated Modes_of_Introduction, Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Relationships | |
| CWE Content Team | MITRE | updated Related_Attack_Patterns, Relationships | |
| CWE Content Team | MITRE | updated Description, References, Relationships | |
| CWE Content Team | MITRE | updated Mapping_Notes | |
| CWE Content Team | MITRE | updated Common_Consequences, Description, Weakness_Ordinalities | |
| CWE Content Team | MITRE | updated Background_Details, Common_Consequences, Description |
