CWE-1338
Improper Protections Against Hardware Overheating
2020-12-10
00h00 +00:00
00h00 +00:00
特定のCWEの通知
特定のCWEの変更情報をいち早くお届けします。
名前: Improper Protections Against Hardware Overheating
A hardware device is missing or has inadequate protection features to prevent overheating.
一般情報
導入モード
Architecture and DesignImplementation : Such issues could be introduced during hardware architecture, design or implementation.
適用可能なプラットフォーム
言語
クラス： Not Language-Specific (Undetermined)オペレーティングシステム
クラス： Not OS-Specific (Undetermined)アーキテクチャ
クラス： Not Architecture-Specific (Undetermined)テクノロジー
クラス： Not Technology-Specific (Undetermined)クラス： ICS/OT (Undetermined)
名前： Power Management Hardware (Undetermined)
名前： Processor Hardware (Undetermined)
一般的な結果
| スコープ | 影響 | 可能性 |
|---|---|---|
| Availability | DoS: Resource Consumption (Other) | High |
潜在的な緩和策
Phases : Architecture and DesignTemperature maximum and minimum limits should be enforced using thermal sensors both in silicon and at the platform level.
Phases : Implementation
The platform should support cooling solutions such as fans that can be modulated based on device-operation needs to maintain a stable temperature.
検出方法
Dynamic Analysis with Manual Results Interpretation
Dynamic tests should be performed to stress-test temperature controls.有効性 : High
Architecture or Design Review
Power management controls should be part of Architecture and Design reviews.有効性 : High
脆弱性マッピングノート
理由 : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.コメント : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
関連する攻撃パターン
| CAPEC ID | 攻撃パターン名 |
|---|---|
| CAPEC-624 | Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
| CAPEC-625 | Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
参考文献
REF-1156
Loapi--This Trojan is hot!Leonid Grustniy.
https://www.kaspersky.com/blog/loapi-trojan/20510/
登録情報
| 名前 | 組織 | 日付 | リリース日 | Version |
|---|---|---|---|---|
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna | Intel Corporation | 4.3 |
変更履歴
| 名前 | 組織 | 日付 | コメント |
|---|---|---|---|
| CWE Content Team | MITRE | updated Applicable_Platforms, Relationships | |
| CWE Content Team | MITRE | updated Applicable_Platforms | |
| CWE Content Team | MITRE | updated Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Applicable_Platforms, Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Relationships | |
| CWE Content Team | MITRE | updated Mapping_Notes | |
| CWE Content Team | MITRE | updated Weakness_Ordinalities | |
| CWE Content Team | MITRE | updated Dimensions, Relationships |
