CWE-1248
Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
2020-02-24
00h00 +00:00
00h00 +00:00
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Tên: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
The security-sensitive hardware module contains semiconductor defects.
Thông tin chung
Chi tiết nền tảng
Các cách xuất hiện
Manufacturing : May be introduced due to issues in the manufacturing environment or improper handling of components, for example.Operation : May be introduced by improper handling or usage outside of rated operating environments (temperature, humidity, etc.)
Nền tảng áp dụng
Ngôn ngữ
Lớp: Not Language-Specific (Undetermined)Hệ điều hành
Lớp: Not OS-Specific (Undetermined)Kiến trúc
Lớp: Not Architecture-Specific (Undetermined)Công nghệ
Lớp: Not Technology-Specific (Undetermined)Hậu quả phổ biến
| Phạm vi | Tác động | Khả năng xảy ra |
|---|---|---|
| Availability Access Control | DoS: Instability Ghi chú: Semiconductor defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised. |
Các biện pháp giảm thiểu tiềm năng
Phases : TestingPhases : Operation
Ghi chú ánh xạ lỗ hổng
Lý do : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.Bình luận : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
Mẫu tấn công liên quan
| ID CAPEC | Tên mẫu tấn công |
|---|---|
| CAPEC-624 | Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
| CAPEC-625 | Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
Tài liệu tham khảo
REF-1067
Why Chips DieBrian Bailey.
https://semiengineering.com/why-chips-die/
REF-1068
What causes semiconductor devices to failV. Lakshminarayan.
Original
Gửi
| Tên | Tổ chức | Ngày | Ngày phát hành | Version |
|---|---|---|---|---|
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi | Intel Corporation | 4.0 |
Sửa đổi
| Tên | Tổ chức | Ngày | Bình luận |
|---|---|---|---|
| CWE Content Team | MITRE | updated Modes_of_Introduction, Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Relationships | |
| CWE Content Team | MITRE | updated Related_Attack_Patterns, Relationships | |
| CWE Content Team | MITRE | updated Description, References, Relationships | |
| CWE Content Team | MITRE | updated Mapping_Notes | |
| CWE Content Team | MITRE | updated Common_Consequences, Description, Weakness_Ordinalities | |
| CWE Content Team | MITRE | updated Background_Details, Common_Consequences, Description |
