Các cách xuất hiện
Architecture and Design
Implementation : Such issues could be introduced during hardware architecture, design or implementation.
Nền tảng áp dụng
Ngôn ngữ
Lớp: Not Language-Specific (Undetermined)
Hệ điều hành
Lớp: Not OS-Specific (Undetermined)
Kiến trúc
Lớp: Not Architecture-Specific (Undetermined)
Công nghệ
Lớp: Not Technology-Specific (Undetermined)
Lớp: ICS/OT (Undetermined)
Tên: Power Management Hardware (Undetermined)
Tên: Processor Hardware (Undetermined)
Hậu quả phổ biến
| Phạm vi |
Tác động |
Khả năng xảy ra |
| Availability | DoS: Resource Consumption (Other) | High |
Các biện pháp giảm thiểu tiềm năng
Phases : Architecture and Design
Temperature maximum and minimum limits should be enforced using thermal sensors both in silicon and at the platform level.
Phases : Implementation
The platform should support cooling solutions such as fans that can be modulated based on device-operation needs to maintain a stable temperature.
Phương pháp phát hiện
Dynamic Analysis with Manual Results Interpretation
Dynamic tests should be performed to stress-test temperature controls.
Hiệu quả : High
Architecture or Design Review
Power management controls should be part of Architecture and Design reviews.
Hiệu quả : High
Ghi chú ánh xạ lỗ hổng
Lý do : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.
Bình luận : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
Mẫu tấn công liên quan
| ID CAPEC |
Tên mẫu tấn công |
| CAPEC-624 |
Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
| CAPEC-625 |
Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
Tài liệu tham khảo
REF-1156
Loapi--This Trojan is hot!
Leonid Grustniy.
https://www.kaspersky.com/blog/loapi-trojan/20510/
Gửi
| Tên |
Tổ chức |
Ngày |
Ngày phát hành |
Version |
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna |
Intel Corporation |
2020-05-29 +00:00 |
2020-12-10 +00:00 |
4.3 |
Sửa đổi
| Tên |
Tổ chức |
Ngày |
Bình luận |
| CWE Content Team |
MITRE |
2022-04-28 +00:00 |
updated Applicable_Platforms, Relationships |
| CWE Content Team |
MITRE |
2022-06-28 +00:00 |
updated Applicable_Platforms |
| CWE Content Team |
MITRE |
2022-10-13 +00:00 |
updated Related_Attack_Patterns |
| CWE Content Team |
MITRE |
2023-01-31 +00:00 |
updated Applicable_Platforms, Related_Attack_Patterns |
| CWE Content Team |
MITRE |
2023-04-27 +00:00 |
updated Relationships |
| CWE Content Team |
MITRE |
2023-06-29 +00:00 |
updated Mapping_Notes |
| CWE Content Team |
MITRE |
2025-12-11 +00:00 |
updated Weakness_Ordinalities |
| CWE Content Team |
MITRE |
2026-10-28 +00:00 |
updated Dimensions, Relationships |