CWE-1246
Improper Write Handling in Limited-write Non-Volatile Memories
2020-02-24
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指定 CWE 通知
掌握特定 CWE 的任何變更。
名稱: Improper Write Handling in Limited-write Non-Volatile Memories
The product does not implement or incorrectly implements wear leveling operations in limited-write non-volatile memories.
一般資訊
背景詳情
引入方式
Architecture and DesignImplementation
適用平台
程式語言
類別： Not Language-Specific (Undetermined)作業系統
類別： Not OS-Specific (Undetermined)架構
類別： Not Architecture-Specific (Undetermined)技術
類別： System on Chip (Undetermined)名稱： Memory Hardware (Undetermined)
名稱： Storage Hardware (Undetermined)
常見後果
| 範圍 | 影響 | 可能性 |
|---|---|---|
| Availability | DoS: Instability 注意：If wear leveling is improperly implemented, attackers may be able to programmatically cause the storage to become unreliable within a much shorter time than would normally be expected. |
潛在緩解措施
Phases : Architecture and Design // Implementation // TestingInclude secure wear leveling algorithms and ensure they may not be bypassed.
漏洞對應備注
理由說明 : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.備註 : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
相關攻擊模式
| CAPEC ID | 攻擊模式名稱 |
|---|---|
| CAPEC-212 | Functionality Misuse
An adversary leverages a legitimate capability of an application in such a way as to achieve a negative technical impact. The system functionality is not altered or modified but used in a way that was not intended. This is often accomplished through the overuse of a specific functionality or by leveraging functionality with design flaws that enables the adversary to gain access to unauthorized, sensitive data. |
參考資料
REF-1058
Enhancing Lifetime and Security of PCM-Based Main Memory with Start-Gap Wear LevelingMoinuddin Qureshi, Michele Franchescini, Vijayalakshmi Srinivasan, Luis Lastras, Bulent Abali, John Karidis.
https://www.seas.upenn.edu/~leebcc/teachdir/ece299_fall10/Qureshi09_pcmWear.pdf
REF-1059
Bad Block Management in NAND Flash MemoryMicron.
https://e2e.ti.com/cfs-file/__key/communityserver-discussions-components-files/791/tn2959_5F00_bbm_5F00_in_5F00_nand_5F00_flash.pdf
提交
| 名稱 | 機構 | 日期 | 發布日期 | Version |
|---|---|---|---|---|
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi | Intel Corporation | 4.0 |
修改記錄
| 名稱 | 機構 | 日期 | 備註 |
|---|---|---|---|
| CWE Content Team | MITRE | updated Demonstrative_Examples, Description, Potential_Mitigations, Research_Gaps | |
| CWE Content Team | MITRE | updated Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Applicable_Platforms | |
| CWE Content Team | MITRE | updated Applicable_Platforms | |
| CWE Content Team | MITRE | updated Demonstrative_Examples, Relationships, Research_Gaps | |
| CWE Content Team | MITRE | updated References, Relationships, Taxonomy_Mappings | |
| CWE Content Team | MITRE | updated Mapping_Notes | |
| CWE Content Team | MITRE | updated Demonstrative_Examples, References | |
| CWE Content Team | MITRE | updated References | |
| CWE Content Team | MITRE | updated Common_Consequences, Description, Weakness_Ordinalities | |
| CWE Content Team | MITRE | updated Background_Details, Description |
