名稱: Improper Protections Against Hardware Overheating

A hardware device is missing or has inadequate protection features to prevent overheating.

一般資訊

引入方式

Architecture and Design
Implementation : Such issues could be introduced during hardware architecture, design or implementation.

適用平台

程式語言

類別： Not Language-Specific (Undetermined)

作業系統

類別： Not OS-Specific (Undetermined)

架構

類別： Not Architecture-Specific (Undetermined)

技術

類別： Not Technology-Specific (Undetermined)
類別： ICS/OT (Undetermined)
名稱： Power Management Hardware (Undetermined)
名稱： Processor Hardware (Undetermined)

常見後果

範圍	影響	可能性
Availability	DoS: Resource Consumption (Other)	High

潛在緩解措施

Phases : Architecture and Design
Temperature maximum and minimum limits should be enforced using thermal sensors both in silicon and at the platform level.
Phases : Implementation
The platform should support cooling solutions such as fans that can be modulated based on device-operation needs to maintain a stable temperature.

偵測方法

Dynamic Analysis with Manual Results Interpretation

Dynamic tests should be performed to stress-test temperature controls.
有效性 : High

Architecture or Design Review

Power management controls should be part of Architecture and Design reviews.
有效性 : High

漏洞對應備注

理由說明 : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.
備註 : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.

相關攻擊模式

CAPEC ID	攻擊模式名稱
CAPEC-624	Hardware Fault Injection The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information.
CAPEC-625	Mobile Device Fault Injection Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised.

參考資料

REF-1156

Loapi--This Trojan is hot!
Leonid Grustniy.
https://www.kaspersky.com/blog/loapi-trojan/20510/

提交

名稱	機構	日期	發布日期	Version
Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna	Intel Corporation	2020-05-29 +00:00	2020-12-10 +00:00	4.3

修改記錄

名稱	機構	日期	備註
CWE Content Team	MITRE	2022-04-28 +00:00	updated Applicable_Platforms, Relationships
CWE Content Team	MITRE	2022-06-28 +00:00	updated Applicable_Platforms
CWE Content Team	MITRE	2022-10-13 +00:00	updated Related_Attack_Patterns
CWE Content Team	MITRE	2023-01-31 +00:00	updated Applicable_Platforms, Related_Attack_Patterns
CWE Content Team	MITRE	2023-04-27 +00:00	updated Relationships
CWE Content Team	MITRE	2023-06-29 +00:00	updated Mapping_Notes
CWE Content Team	MITRE	2025-12-11 +00:00	updated Weakness_Ordinalities
CWE Content Team	MITRE	2026-10-28 +00:00	updated Dimensions, Relationships

CWE-1338 詳細資料

CWE-1338