CWE-1248
Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
Incomplete
2020-02-24
00h00 +00:00
00h00 +00:00
2025-12-11
00h00 +00:00
00h00 +00:00
Benachrichtigungen für ein CWE
Bleiben Sie über alle Änderungen zu einem bestimmten CWE informiert.
Name: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
The security-sensitive hardware module contains semiconductor defects.
Allgemeine Informationen
Einführungsmodi
Manufacturing : May be introduced due to issues in the manufacturing environment or improper handling of components, for example.Operation : May be introduced by improper handling or usage outside of rated operating environments (temperature, humidity, etc.)
Anwendbare Plattformen
Sprache
Class: Not Language-Specific (Undetermined)Betriebssysteme
Class: Not OS-Specific (Undetermined)Architekturen
Class: Not Architecture-Specific (Undetermined)Technologien
Class: Not Technology-Specific (Undetermined)Häufige Konsequenzen
| Bereich | Auswirkung | Wahrscheinlichkeit |
|---|---|---|
| Availability Access Control | DoS: Instability Note: If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised. |
Mögliche Gegenmaßnahmen
Phases : TestingPhases : Operation
Hinweise zur Schwachstellen-Zuordnung
Begründung : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.Kommentar : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
Verwandte Angriffsmuster
| CAPEC-ID | Name des Angriffsmusters |
|---|---|
| CAPEC-624 | Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
| CAPEC-625 | Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
Referenzen
REF-1067
Why Chips DieBrian Bailey.
https://semiengineering.com/why-chips-die/
REF-1068
What causes semiconductor devices to failV. Lakshminarayan.
Original
Einreichung
| Name | Organisation | Datum | Veröffentlichungsdatum | Version |
|---|---|---|---|---|
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi | Intel Corporation | 4.0 |
Änderungen
| Name | Organisation | Datum | Kommentar |
|---|---|---|---|
| CWE Content Team | MITRE | updated Modes_of_Introduction, Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Relationships | |
| CWE Content Team | MITRE | updated Related_Attack_Patterns, Relationships | |
| CWE Content Team | MITRE | updated Description, References, Relationships | |
| CWE Content Team | MITRE | updated Mapping_Notes | |
| CWE Content Team | MITRE | updated Common_Consequences, Description, Weakness_Ordinalities |
