이름: Debug and Test Problems

Weaknesses in this category are related to hardware debug and test interfaces such as JTAG and scan chain.

CWE 구성원 목록

CWE-1191: On-Chip Debug and Test Interface With Improper Access Control 기본

CWE-1234: Hardware Internal or Debug Modes Allow Override of Locks 기본

CWE-1243: Sensitive Non-Volatile Information Not Protected During Debug 기본

CWE-1244: Internal Asset Exposed to Unsafe Debug Access Level or State 기본

CWE-1258: Exposure of Sensitive System Information Due to Uncleared Debug Information 기본

CWE-1272: Sensitive Information Uncleared Before Debug/Power State Transition 기본

CWE-1291: Public Key Re-Use for Signing both Debug and Production Code 기본

CWE-1295: Debug Messages Revealing Unnecessary Information 기본

CWE-1296: Incorrect Chaining or Granularity of Debug Components 기본

CWE-1313: Hardware Allows Activation of Test or Debug Logic at Runtime 기본

CWE-1323: Improper Management of Sensitive Trace Data 기본

CWE-319: Cleartext Transmission of Sensitive Information 기본

CWE 정보

취약점 매핑 메모

근거 : This entry is a Category. Using categories for mapping has been discouraged since 2019. Categories are informal organizational groupings of weaknesses that can help CWE users with data aggregation, navigation, and browsing. However, they are not weaknesses in themselves.
댓글 : See member weaknesses of this category.

제출

이름	조직	날짜	출시일	Version
CWE Content Team	MITRE	2019-12-27 +00:00	2020-02-24 +00:00	4.0

수정 사항

이름	조직	날짜	댓글
CWE Content Team	MITRE	2020-06-25 +00:00	updated Relationships
CWE Content Team	MITRE	2020-08-20 +00:00	updated Relationships
CWE Content Team	MITRE	2020-12-10 +00:00	updated Relationships
CWE Content Team	MITRE	2023-01-31 +00:00	updated Relationships
CWE Content Team	MITRE	2023-04-27 +00:00	updated Mapping_Notes
CWE Content Team	MITRE	2023-06-29 +00:00	updated Mapping_Notes

CWE-1207 카테고리 상세 정보

CWE-1207