CWE-1246
Improper Write Handling in Limited-write Non-Volatile Memories
2020-02-24
00h00 +00:00
00h00 +00:00
指定 CWE 通知
随时了解指定 CWE 的变更。
名称: Improper Write Handling in Limited-write Non-Volatile Memories
The product does not implement or incorrectly implements wear leveling operations in limited-write non-volatile memories.
基本信息
背景详情
引入方式
Architecture and DesignImplementation
适用平台
编程语言
类： Not Language-Specific (Undetermined)操作系统
类： Not OS-Specific (Undetermined)架构
类： Not Architecture-Specific (Undetermined)技术
类： System on Chip (Undetermined)名称： Memory Hardware (Undetermined)
名称： Storage Hardware (Undetermined)
常见后果
| 影响范围 | 影响 | 可能性 |
|---|---|---|
| Availability | DoS: Instability 注意： If wear leveling is improperly implemented, attackers may be able to programmatically cause the storage to become unreliable within a much shorter time than would normally be expected. |
潜在缓解措施
Phases : Architecture and Design // Implementation // TestingInclude secure wear leveling algorithms and ensure they may not be bypassed.
漏洞映射说明
依据 : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.备注 : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
相关攻击模式
| CAPEC ID | 攻击模式名称 |
|---|---|
| CAPEC-212 | Functionality Misuse
An adversary leverages a legitimate capability of an application in such a way as to achieve a negative technical impact. The system functionality is not altered or modified but used in a way that was not intended. This is often accomplished through the overuse of a specific functionality or by leveraging functionality with design flaws that enables the adversary to gain access to unauthorized, sensitive data. |
参考资料
REF-1058
Enhancing Lifetime and Security of PCM-Based Main Memory with Start-Gap Wear LevelingMoinuddin Qureshi, Michele Franchescini, Vijayalakshmi Srinivasan, Luis Lastras, Bulent Abali, John Karidis.
https://www.seas.upenn.edu/~leebcc/teachdir/ece299_fall10/Qureshi09_pcmWear.pdf
REF-1059
Bad Block Management in NAND Flash MemoryMicron.
https://e2e.ti.com/cfs-file/__key/communityserver-discussions-components-files/791/tn2959_5F00_bbm_5F00_in_5F00_nand_5F00_flash.pdf
提交记录
| 名称 | 组织 | 日期 | 发布日期 | Version |
|---|---|---|---|---|
| Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi | Intel Corporation | 4.0 |
修改记录
| 名称 | 组织 | 日期 | 备注 |
|---|---|---|---|
| CWE Content Team | MITRE | updated Demonstrative_Examples, Description, Potential_Mitigations, Research_Gaps | |
| CWE Content Team | MITRE | updated Related_Attack_Patterns | |
| CWE Content Team | MITRE | updated Applicable_Platforms | |
| CWE Content Team | MITRE | updated Applicable_Platforms | |
| CWE Content Team | MITRE | updated Demonstrative_Examples, Relationships, Research_Gaps | |
| CWE Content Team | MITRE | updated References, Relationships, Taxonomy_Mappings | |
| CWE Content Team | MITRE | updated Mapping_Notes | |
| CWE Content Team | MITRE | updated Demonstrative_Examples, References | |
| CWE Content Team | MITRE | updated References | |
| CWE Content Team | MITRE | updated Common_Consequences, Description, Weakness_Ordinalities | |
| CWE Content Team | MITRE | updated Background_Details, Description |
