Modos de introducción
Architecture and Design : Such issues could be introduced during hardware architecture and design and identified later during Testing or System Configuration phases.
Implementation : Such issues could be introduced during implementation and identified later during Testing or System Configuration phases.
Integration : Such issues could be introduced during integration and identified later during Testing or System Configuration phases.
Plataformas aplicables
Lenguaje
Class: Not Language-Specific (Undetermined)
Sistemas operativos
Class: Not OS-Specific (Undetermined)
Arquitecturas
Class: Not Architecture-Specific (Undetermined)
Tecnologías
Class: Not Technology-Specific (Undetermined)
Consecuencias comunes
| Alcance |
Impacto |
Probabilidad |
Integrity Availability | DoS: Crash, Exit, or Restart, DoS: Instability, Quality Degradation, DoS: Resource Consumption (CPU), DoS: Resource Consumption (Memory), DoS: Resource Consumption (Other), Reduce Performance, Reduce Reliability, Unexpected State | |
Mitigaciones potenciales
Phases : Architecture and Design
Ensure the design does not allow error injection in modes intended for normal run-time operation. Provide access controls on interfaces for injecting errors.
Phases : Implementation
Disallow error injection in modes which are expected to be used for normal run-time operation. Provide access controls on interfaces for injecting errors.
Phases : Integration
Add an access control layer atop any unprotected interfaces for injecting errors.
Notas de mapeo de vulnerabilidades
Justificación : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.
Comentario : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
Patrones de ataque relacionados
| CAPEC-ID |
Nombre del patrón de ataque |
| CAPEC-624 |
Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
| CAPEC-625 |
Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
Envío
| Nombre |
Organización |
Fecha |
Fecha de lanzamiento |
Version |
| James Pangburn |
Accellera IP Security Assurance (IPSA) Working Group |
2020-07-29 +00:00 |
2020-12-10 +00:00 |
4.3 |
Modificaciones
| Nombre |
Organización |
Fecha |
Comentario |
| CWE Content Team |
MITRE |
2023-01-31 +00:00 |
updated Related_Attack_Patterns |
| CWE Content Team |
MITRE |
2023-04-27 +00:00 |
updated Relationships |
| CWE Content Team |
MITRE |
2023-06-29 +00:00 |
updated Mapping_Notes |
| CWE Content Team |
MITRE |
2025-12-11 +00:00 |
updated Weakness_Ordinalities |