Modes d'introduction
Implementation
Plateformes applicables
Langue
Class: Not Language-Specific (Undetermined)
Conséquences courantes
| Portée |
Impact |
Probabilité |
| Other | Reduce Maintainability, Increase Analytical Complexity
Note: This issue makes it more difficult to understand and/or maintain the product, which indirectly affects security by making it more difficult or time-consuming to find and/or fix vulnerabilities. It also might make it easier to introduce vulnerabilities. | |
Méthodes de détection
Automated Static Analysis
Automated static analysis, commonly referred to as Static Application Security Testing (SAST), can find some instances of this weakness by analyzing source code (or binary/compiled code) without having to execute it. Typically, this is done by building a model of data flow and control flow, then searching for potentially-vulnerable patterns that connect "sources" (origins of input) with "sinks" (destinations where the data interacts with external components, a lower layer such as the OS, etc.)
Notes de cartographie des vulnérabilités
Justification : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.
Commentaire : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.
Soumission
| Nom |
Organisation |
Date |
Date de publication |
Version |
| CWE Content Team |
MITRE |
2018-07-02 +00:00 |
2019-01-03 +00:00 |
3.2 |
Modifications
| Nom |
Organisation |
Date |
Commentaire |
| CWE Content Team |
MITRE |
2023-01-31 +00:00 |
updated Description |
| CWE Content Team |
MITRE |
2023-04-27 +00:00 |
updated Relationships |
| CWE Content Team |
MITRE |
2023-06-29 +00:00 |
updated Mapping_Notes |
| CWE Content Team |
MITRE |
2025-12-11 +00:00 |
updated Applicable_Platforms, Common_Consequences, Description, Detection_Factors, Time_of_Introduction |