CWE-1248 Detalhe

CWE-1248

Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
Incomplete
2020-02-24
00h00 +00:00
2025-12-11
00h00 +00:00
Notificações para um CWE
Fique informado sobre quaisquer alterações para um CWE específico.
Gerenciar notificações

Nome: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications

The security-sensitive hardware module contains semiconductor defects.

Informações Gerais

Modos de Introdução

Manufacturing : May be introduced due to issues in the manufacturing environment or improper handling of components, for example.
Operation : May be introduced by improper handling or usage outside of rated operating environments (temperature, humidity, etc.)

Plataformas Aplicáveis

Linguagem

Class: Not Language-Specific (Undetermined)

Sistemas Operacionais

Class: Not OS-Specific (Undetermined)

Arquiteturas

Class: Not Architecture-Specific (Undetermined)

Tecnologias

Class: Not Technology-Specific (Undetermined)

Consequências Comuns

Escopo Impacto Probabilidade
Availability
Access Control
DoS: Instability

Note: If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.

Mitigações Potenciais

Phases : Testing
Phases : Operation

Notas de Mapeamento de Vulnerabilidade

Justificativa : This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.
Comentário : Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.

Padrões de Ataque Relacionados

CAPEC-ID Nome do Padrão de Ataque
CAPEC-624 Hardware Fault Injection
The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information.
CAPEC-625 Mobile Device Fault Injection
Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised.

Referências

REF-1067

Why Chips Die
Brian Bailey.
https://semiengineering.com/why-chips-die/

REF-1068

What causes semiconductor devices to fail
V. Lakshminarayan.
Original

Submissão

Nome Organização Data Data de lançamento Version
Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi Intel Corporation 2020-02-12 +00:00 2020-02-24 +00:00 4.0

Modificações

Nome Organização Data Comentário
CWE Content Team MITRE 2020-08-20 +00:00 updated Modes_of_Introduction, Related_Attack_Patterns
CWE Content Team MITRE 2022-06-28 +00:00 updated Relationships
CWE Content Team MITRE 2023-01-31 +00:00 updated Related_Attack_Patterns, Relationships
CWE Content Team MITRE 2023-04-27 +00:00 updated Description, References, Relationships
CWE Content Team MITRE 2023-06-29 +00:00 updated Mapping_Notes
CWE Content Team MITRE 2025-12-11 +00:00 updated Common_Consequences, Description, Weakness_Ordinalities